xchen

2011
Chen, X., "Atomic force microscope (AFM) cantilevers as encoder for real-time displacement measurements", Berichte aus dem Institut für Elektrische Messtechnik und Grundlagen der Elektrotechnik, vol. Dr.-Ing.: Technische Universität Braunschweig, pp. 187, 2011. Abstract
Chen, X., L. Koenders, and F. Härtig, "Real-time cross-correlation filtering of a one-dimensional grating position-encoded signal", Measurement Science and Technology, vol. 22, issue 8, pp. 085105, 06/2011. Abstract
2010