Scanning Probe Microscopes

Title of series 
Foundations of Metrology – Instrumentation
Event Type 

Over the last three decades various methods based on scanning probe microscopy have been developed to locally study the electron density of states or the surface potentials, oftentimes reaching atomic resolution. In this lecture I will give a review of some of the most common techniques and their applications.

2018/05/17 - 17:15 - 18:45
Institut für Elektrische Messtechnik und Grundlagen der Elektrotechnik
Hans-Sommer-Str. 66
38106 Braunschweig
5th floor, room 518