Electrical Measurements and Noise

Title of series 
Foundations of Metrology – Instrumentation
Event Type 

Measurement uncertainty is an important topic in metrology and therefore in the center of our discussions in the Research Training Group 1952 „NanoMet“. In all measurements the measurement uncertainty contains statistical and systematic contributions. In this presentation we will discuss, which contributions have to be considered in electrical measurements and what the main sources of statistical contributions are. Noise measurements can help to sort out the sources and finally can help to improve the measurement data. We will further discuss how statistical noise can be distinguished from disturbing signals from the environment.

2018/04/12 - 17:15 - 18:45
Institut für Elektrische Messtechnik und Grundlagen der Elektrotechnik
Hans-Sommer-Str. 66
38106 Braunschweig
5th floor, room 518