AFM as sensor to detect translation and rotation

Focus: 
Nanometrology

AFM are high resolution microscopes, which are able to achieve atomic resolution on crystalline surfaces. Up to now these microscopes only are used to investigate technical surface and to measure surface features, like steps, lines, periodical pattern, the roughness, and others with high resolution. Limits are related to the precise characterization of the tip shape.

In the proposed work the AFM, or better a compact AFM head, should be used as sensor to detect translation or rotation. The AFM head should be used to pick-up changes of the position from the movement or after a patented principle the rotation of a moving grating. For unequivocal identification of the movement it would be necessary to use at least two heads. Therefore, as first step it is necessary to analyse signals of AFM heads and to determine the number of heads necessary and of their arrangement. A compact AFM head has to be designed, to set-up and the properties have to be investigated. Depending on the progress 1D or 2D optical gratings of 300 nm pitch or smaller may be used for the verification of the functional principle. The final aim would be the use of atomic gratings.
Points to be considered in the work are the alignment of each cantilever, a compact head including deflection detectors, piezos and electronics for local feedback control for each cantilever, and real-time analysis of the signals. For some parts it would be necessary to develop new and challenging methods and techniques.

Mentor/s: 
Härtig
Mentor/s: 
Koenders
Mentor/s: 
Schilling
Institution: 
PTB
Institution: 
TU Braunschweig
Status: 
completed
Ph.D. student: 
Chen